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Schottky diode series resistance and thermal resistance extraction from S-parameter and temperature controlled IV measurements

Research output: Contribution to journalArticleScientificpeer-review

56 Citations (Scopus)
Original languageEnglish
Pages (from-to)2108-2116
JournalIEEE Transactions on Microwave Theory and Techniques
Volume59
Issue number8
Publication statusPublished - 2011
MoE publication typeA1 Journal article-refereed

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