Schottky diode series resistance and thermal resistance extraction from S-parameter and temperature controlled IV measurements

Tero Kiuru, Juha Mallat, Antti V. Räisänen, Tapani Närhi

Research output: Contribution to journalArticleScientificpeer-review

52 Citations (Scopus)
Original languageEnglish
Pages (from-to)2108-2116
JournalIEEE Transactions on Microwave Theory and Techniques
Volume59
Issue number8
Publication statusPublished - 2011
MoE publication typeA1 Journal article-refereed

Cite this