Scanning probe microscopy and spectroscopy

Peter Liljeroth, Bruno Grandidier*, Christophe Delerue, Daniël Vanmaekelbergh

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

1 Citation (Scopus)

Abstract

This chapter shows how scanning tunneling microscopy and spectroscopy and atomic force microscopy can be used to measure the properties of individual nanocrystals, thereby circumventing the limitations of ensemble based measurements.

Original languageEnglish
Title of host publicationNanoparticles: Workhorses of Nanoscience
PublisherSpringer-Verlag Berlin Heidelberg
Pages223-255
Number of pages33
ISBN (Electronic)9783662448236
ISBN (Print)366244822X, 9783662448229
DOIs
Publication statusPublished - 1 Sep 2014
MoE publication typeA3 Part of a book or another research book

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