SAW Device Analysis Using a Combination of FEM/BEM Calculations and Scanning Interferometer Measurements

S. Chamaly, R. Lardat, T. Pastureaud, P. Dufilie, W. Steichen, O. Holmgren, M. Kuitunen, J.V. Knuuttila, M.M. Salomaa

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    5 Citations (Scopus)
    Original languageEnglish
    Title of host publication2003 IEEE Ultrasonics Symposium, Hawaiji lokakuu 2003
    Publication statusPublished - 2003
    MoE publication typeA4 Article in a conference publication

    Cite this