Original language | English |
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Title of host publication | 2003 IEEE Ultrasonics Symposium, Hawaiji lokakuu 2003 |
Pages | 294 |
Publication status | Published - 2003 |
MoE publication type | A4 Article in a conference publication |
SAW Device Analysis Using a Combination of FEM/BEM Calculations and Scanning Interferometer Measurements
S. Chamaly, R. Lardat, T. Pastureaud, P. Dufilie, W. Steichen, O. Holmgren, M. Kuitunen, J.V. Knuuttila, M.M. Salomaa
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review
5
Citations
(Scopus)