Role of image forces in non-contact scanning force microscope images of ionic surfaces

L. N. Kantorovich*, A. S. Foster, A. L. Shluger, A. M. Stoneham

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

48 Citations (Scopus)

Abstract

We consider the effect of the image interaction on the force acting between tip and surface in non-contact scanning force microscope experiments. This interaction is relevant when a conducting tip interacts with either a polar bulk sample or with a thick film grown on a conducting substrate. We compare the atomistic contribution due to the interaction between the microscopic tip apex and the sample with the macroscopic van der Waals and image contributions to the force on the tip for several representative NaCl clusters adsorbed on a metal substrate. We show that the microscopic force dominates above the plain (001) terrace sites and is solely responsible for image contrast. However, the image force becomes comparable to the microscopic force above the surface di-vacancy and dominates the interaction above a charged step.

Original languageEnglish
Pages (from-to)283-299
Number of pages17
JournalSurface Science
Volume445
Issue number2-3
DOIs
Publication statusPublished - 20 Jan 2000
MoE publication typeA1 Journal article-refereed

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