Role of Excessive Vacancy Generated in p-n Type Duplex Cu2O Film under Anodic Bias in TGSCC of Pure Copper

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationThe European Corrosion Congress, EUROCORR 2011, September 4-8, 2011, Stockholm, Sweden
Pages12
Publication statusPublished - 2011
MoE publication typeA4 Article in a conference publication

Cite this

Aaltonen, P., Yagodzinskyy, Y., Kilpeläinen, S., Tuomisto, F., & Hänninen, H. (2011). Role of Excessive Vacancy Generated in p-n Type Duplex Cu2O Film under Anodic Bias in TGSCC of Pure Copper. In The European Corrosion Congress, EUROCORR 2011, September 4-8, 2011, Stockholm, Sweden (pp. 12)