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Role of copper in light induced minority-carrier lifetime degradation of silicon

    Research output: Contribution to journalArticleScientificpeer-review

    54 Citations (Scopus)
    57 Downloads (Pure)
    Original languageEnglish
    Pages (from-to)152111
    JournalApplied Physics Letters
    Volume95
    Issue number15
    DOIs
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Copper contamination
    • Crystalline silicon materials
    • Degradation effect
    • Minority carrier lifetimes

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