Role of copper in light induced minority-carrier lifetime degradation of silicon

H. Savin, M. Yli-Koski, A. Haarahiltunen

    Research output: Contribution to journalArticleScientificpeer-review

    48 Citations (Scopus)
    21 Downloads (Pure)
    Original languageEnglish
    Pages (from-to)152111
    JournalApplied Physics Letters
    Volume95
    Issue number15
    DOIs
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Copper contamination
    • Crystalline silicon materials
    • Degradation effect
    • Minority carrier lifetimes

    Cite this