Robustness and reliability of MOEMS for miniature spectrometers

A. Rissanen*, M. Broas, J. Hokka, T. Mattila, J. Antila, M. Laamanen, H. Saari

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    3 Citations (Scopus)

    Abstract

    Tunable MOEMS Fabry-Perot interferometers (FPIs) are key elements in the miniaturization of spectroscopic instrumentation. Robustness and high reliability of the MOEMS structure are important factors especially for sensors utilized in challenging environments such as in space- and automotive applications. This paper presents reliability assessment of two types of MOEMS optical filters; a tunable ALD (atomic layer deposition) -based surface micromachined FPI for visible - near-infrared range, and a tunable FPI for mid- infrared applications based on LPCVD (low-pressure chemical vapor deposition) thin-film micromachining. High-G shock tests were performed on both MOEMS FPIs. The FPI structures can survive mechanical impact up to 18 000 G without any detectable changes in the capacitance, while detected failure mechanisms in this range arise from packaging and not from the MOEMS structures. The effect of DDMS SAM (dichlorodimethylsilane self-assembled monolayer) coating to prevent in-use stiction was evaluated in both humidity- and impact tests. In humidity tests, 20% stiction rate in non-coated devices vs. 0% stiction rate in DDMS-coated LPCVD FPIs under pull-in was observed. These results indicate good shock-impact robustness for both types of surface-micromachined structures, while DDMS SAM can be utilized to improve in-use reliability of MOEMS.

    Original languageEnglish
    Title of host publicationReliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
    Volume8614
    DOIs
    Publication statusPublished - 2013
    MoE publication typeA4 Article in a conference publication
    EventReliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII - San Francisco, CA, United States
    Duration: 4 Feb 20135 Feb 2013

    Conference

    ConferenceReliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
    CountryUnited States
    CitySan Francisco, CA
    Period04/02/201305/02/2013

    Keywords

    • Fabry-Perot interferometer
    • miniature spectrometers
    • MOEMS
    • nanosatellite

    Fingerprint Dive into the research topics of 'Robustness and reliability of MOEMS for miniature spectrometers'. Together they form a unique fingerprint.

    Cite this