Revisiting the Challenges and Opportunities in Software Plagiarism Detection

Xi Xu, Ming Fan, Ang Jia, Yin Wang, Zheng Yan, Qinghua Zheng, Ting Liu

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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Abstract

Software plagiarism seriously impedes the healthy development of open source software. To fight against code obfuscation and inherent non-determinism of thread scheduling applied against software plagiarism detection, we proposed a new dynamic birthmark called DYnamic Key Instruction Sequence (DYKIS) and a framework called Thread-oblivious dynamic Birthmark (TOB) for the purpose of reviving the existing birthmarks and a thread-aware dynamic birthmark called Thread-related System call Birthmark (TreSB). Though many approaches have been proposed for software plagiarism detection, they are still limited to satisfy the following highly desired requirements: the applicability to handle binary, the capability to detect partial plagiarism, the resiliency to code obfuscation, the interpretability on detection results, and the scalability to process large-scale software. In this position paper, we discuss and outline the research opportunities and challenges in the field of software plagiarism detection in order to stimulate brilliant innovations and direct our future research efforts.

Original languageEnglish
Title of host publicationSANER 2020 - Proceedings of the 2020 IEEE 27th International Conference on Software Analysis, Evolution, and Reengineering
EditorsKostas Kontogiannis, Foutse Khomh, Alexander Chatzigeorgiou, Marios-Eleftherios Fokaefs, Minghui Zhou
PublisherIEEE
Pages537-541
Number of pages5
ISBN (Electronic)9781728151434
DOIs
Publication statusPublished - Feb 2020
MoE publication typeA4 Article in a conference publication
EventIEEE International Conference on Software Analysis, Evolution, and Reengineering - London, Canada
Duration: 18 Feb 202021 Feb 2020
Conference number: 27

Conference

ConferenceIEEE International Conference on Software Analysis, Evolution, and Reengineering
Abbreviated titleSANER
CountryCanada
CityLondon
Period18/02/202021/02/2020

Keywords

  • binary code similarity
  • software birthmark
  • software plagiarism detection
  • source code similarity

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    Xu, X., Fan, M., Jia, A., Wang, Y., Yan, Z., Zheng, Q., & Liu, T. (2020). Revisiting the Challenges and Opportunities in Software Plagiarism Detection. In K. Kontogiannis, F. Khomh, A. Chatzigeorgiou, M-E. Fokaefs, & M. Zhou (Eds.), SANER 2020 - Proceedings of the 2020 IEEE 27th International Conference on Software Analysis, Evolution, and Reengineering (pp. 537-541). [9054847] IEEE. https://doi.org/10.1109/SANER48275.2020.9054847