Replacement of the drop test with the vibration test The effect of test temperature on reliability

Toni T. Mattila, Lauri Suotula, Jorma Kivilahti

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    18 Citations (Scopus)
    Original languageEnglish
    Title of host publicationthe 58th Electronic Component and Technology Conference, Orlando, FL, May 27- 30, 2008
    PublisherIEEE CPMT
    Pages627-637
    Publication statusPublished - 2008
    MoE publication typeA4 Article in a conference publication

    Cite this