Reliability Assessment of Conventional Isolated PWM DC-DC Converters

Hadi Tarzamni, Farhad Panahandeh Esmaeelnia, Farzad Tahami*, Mahmud Fotuhi-Firuzabad, Payman Dehghanian, Matti Lehtonen, Frede Blaabjerg

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

23 Citations (Scopus)
219 Downloads (Pure)

Abstract

This paper sets forth the reliability analysis of conventional isolated pulse width modulation DC-DC (IDC-DC) converters. The IDC-DC converters are categorized into isolated single-switch DC-DC (ISSDC-DC) or multiple-switch DC-DC (IMSDC-DC) converters. The proposed framework encompasses analyzing the impacts of duty cycle, input voltage, output power, transformer turns ratio, components characteristics and time duration on the overall reliability performance of the IDC-DC converters. The suggested reliability assessment is centered on Markov models characterized by taking into consideration all open and short circuit faults on the components in both continuous and discontinuous conduction modes. We further investigate the self-embedded fault tolerant capability of the IMSDC-DC converters under open circuit fault scenarios on the switches, diodes and blocking capacitors, where we offer new reliability analytics. Along with extensive analyses and comparisons, several experimental results are provided to verify the self-embedded fault tolerant capability of IMSDC-DC converters.

Original languageEnglish
Article number9382999
Pages (from-to)46191-46200
Number of pages10
JournalIEEE Access
Volume9
DOIs
Publication statusPublished - 22 Mar 2021
MoE publication typeA1 Journal article-refereed

Keywords

  • fault analysis
  • Fault tolerance
  • Fault tolerant systems
  • isolated multiple-switch DC-DC converter (IMSDC-DC)
  • Isolated single-switch DC-DC converter (ISSDC-DC)
  • Markov process
  • Markov processes
  • Power electronics
  • Power system reliability
  • Reliability
  • reliability
  • Reliability engineering

Fingerprint

Dive into the research topics of 'Reliability Assessment of Conventional Isolated PWM DC-DC Converters'. Together they form a unique fingerprint.

Cite this