TY - GEN
T1 - Reflection Phase Characterization of the MEMS-based High Impedance Surface
AU - Du, Zhou
AU - Ala-Laurinaho, Juha
AU - Chicherin, Dmitry
AU - Räisänen, Antti V.
AU - Sterner, Mikael
AU - Oberhammer, Joachim
PY - 2012
Y1 - 2012
KW - electromagnetic reflection
KW - high-impedance surfaces;
KW - micro-electromechanical devices
KW - millimeter wave measurement
KW - electromagnetic reflection
KW - high-impedance surfaces;
KW - micro-electromechanical devices
KW - millimeter wave measurement
KW - electromagnetic reflection
KW - high-impedance surfaces;
KW - micro-electromechanical devices
KW - millimeter wave measurement
U2 - 10.23919/EuMC.2012.6459283
DO - 10.23919/EuMC.2012.6459283
M3 - Conference contribution
SP - 617
EP - 620
BT - 42nd European Microwave Conference, Amsterdam, The Netherlands, 29 Oct - 1 Nov, 2012
CY - Amsterdam, The Netherlands
ER -