Reflection Phase Characterization of the MEMS-based High Impedance Surface

Zhou Du; Juha Ala-Laurinaho; Dmitry Chicherin; Antti V. Räisänen; Mikael Sterner; Joachim Oberhammer

doi:10.23919/EuMC.2012.6459283

Reflection Phase Characterization of the MEMS-based High Impedance Surface

Zhou Du, Juha Ala-Laurinaho, Dmitry Chicherin, Antti V. Räisänen, Mikael Sterner, Joachim Oberhammer

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	42nd European Microwave Conference, Amsterdam, The Netherlands, 29 Oct - 1 Nov, 2012
Place of Publication	Amsterdam, The Netherlands
Pages	617-620
DOIs	https://doi.org/10.23919/EuMC.2012.6459283
Publication status	Published - 2012
MoE publication type	A4 Article in a conference publication

Keywords

electromagnetic reflection
high-impedance surfaces;
micro-electromechanical devices
millimeter wave measurement

Access to Document

10.23919/EuMC.2012.6459283

Cite this

@inproceedings{cf3a9b1024f641e9baec4a826c0e3e64,

title = "Reflection Phase Characterization of the MEMS-based High Impedance Surface",

keywords = "electromagnetic reflection, high-impedance surfaces;, micro-electromechanical devices, millimeter wave measurement, electromagnetic reflection, high-impedance surfaces;, micro-electromechanical devices, millimeter wave measurement, electromagnetic reflection, high-impedance surfaces;, micro-electromechanical devices, millimeter wave measurement",

author = "Zhou Du and Juha Ala-Laurinaho and Dmitry Chicherin and R{\"a}is{\"a}nen, {Antti V.} and Mikael Sterner and Joachim Oberhammer",

year = "2012",

doi = "10.23919/EuMC.2012.6459283",

language = "English",

pages = "617--620",

booktitle = "42nd European Microwave Conference, Amsterdam, The Netherlands, 29 Oct - 1 Nov, 2012",

}

Reflection Phase Characterization of the MEMS-based High Impedance Surface. / Du, Zhou; Ala-Laurinaho, Juha; Chicherin, Dmitry; Räisänen, Antti V.; Sterner, Mikael; Oberhammer, Joachim.

42nd European Microwave Conference, Amsterdam, The Netherlands, 29 Oct - 1 Nov, 2012. Amsterdam, The Netherlands, 2012. p. 617-620.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Reflection Phase Characterization of the MEMS-based High Impedance Surface

AU - Du, Zhou

AU - Ala-Laurinaho, Juha

AU - Chicherin, Dmitry

AU - Räisänen, Antti V.

AU - Sterner, Mikael

AU - Oberhammer, Joachim

PY - 2012

Y1 - 2012

KW - electromagnetic reflection

KW - high-impedance surfaces;

KW - micro-electromechanical devices

KW - millimeter wave measurement

KW - electromagnetic reflection

KW - high-impedance surfaces;

KW - micro-electromechanical devices

KW - millimeter wave measurement

KW - electromagnetic reflection

KW - high-impedance surfaces;

KW - micro-electromechanical devices

KW - millimeter wave measurement

U2 - 10.23919/EuMC.2012.6459283

DO - 10.23919/EuMC.2012.6459283

M3 - Conference contribution

SP - 617

EP - 620

BT - 42nd European Microwave Conference, Amsterdam, The Netherlands, 29 Oct - 1 Nov, 2012

CY - Amsterdam, The Netherlands

ER -