Reflection Phase Characterization of the MEMS-based High Impedance Surface

Zhou Du, Juha Ala-Laurinaho, Dmitry Chicherin, Antti V. Räisänen, Mikael Sterner, Joachim Oberhammer

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication42nd European Microwave Conference, Amsterdam, The Netherlands, 29 Oct - 1 Nov, 2012
    Place of PublicationAmsterdam, The Netherlands
    Pages617-620
    DOIs
    Publication statusPublished - 2012
    MoE publication typeA4 Article in a conference publication

    Keywords

    • electromagnetic reflection
    • high-impedance surfaces;
    • micro-electromechanical devices
    • millimeter wave measurement

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