Reducing light-induced degradation in multi-crystalline silicon

Jeanette Lindroos, Yacine Boulfrad, Marko Yli-Koski, Hele Savin

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationXV Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST), Oxford, UK, September 22-27, 2013
Pages16-3
Publication statusPublished - 2013
MoE publication typeA4 Article in a conference publication

Cite this

Lindroos, J., Boulfrad, Y., Yli-Koski, M., & Savin, H. (2013). Reducing light-induced degradation in multi-crystalline silicon. In XV Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST), Oxford, UK, September 22-27, 2013 (pp. 16-3)