Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods,

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Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods, / Barth, Clemens; Foster, Adam S.; Henry, Claude R.; Shluger, Alexander L.

In: Advanced Materials, Vol. 23, No. 4, 2011, p. 477-501.

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Barth, Clemens ; Foster, Adam S. ; Henry, Claude R. ; Shluger, Alexander L. / Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods,. In: Advanced Materials. 2011 ; Vol. 23, No. 4. pp. 477-501.

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@article{a2fac3af19d74b8cb626abb566897751,
title = "Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods,",
keywords = "AFM, AFM, AFM",
author = "Clemens Barth and Foster, {Adam S.} and Henry, {Claude R.} and Shluger, {Alexander L.}",
year = "2011",
doi = "10.1002/adma.201002270",
language = "English",
volume = "23",
pages = "477--501",
journal = "Advanced Materials",
issn = "0935-9648",
number = "4",

}

RIS - Download

TY - JOUR

T1 - Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods,

AU - Barth, Clemens

AU - Foster, Adam S.

AU - Henry, Claude R.

AU - Shluger, Alexander L.

PY - 2011

Y1 - 2011

KW - AFM

KW - AFM

KW - AFM

U2 - 10.1002/adma.201002270

DO - 10.1002/adma.201002270

M3 - Article

VL - 23

SP - 477

EP - 501

JO - Advanced Materials

JF - Advanced Materials

SN - 0935-9648

IS - 4

ER -

ID: 711882