Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods,

Research output: Contribution to journalArticleScientificpeer-review

Researchers

  • Clemens Barth
  • Adam Foster

  • Claude R. Henry
  • Alexander L. Shluger

Research units

  • CNRS
  • University College London
  • Tohoku University
  • Tampere University of Technology

Details

Original languageEnglish
Pages (from-to)477-501
Number of pages25
JournalAdvanced Materials
Volume23
Issue number4
Publication statusPublished - 2011
MoE publication typeA1 Journal article-refereed

    Research areas

  • AFM

ID: 711882