Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods,

Clemens Barth, Adam S. Foster, Claude R. Henry, Alexander L. Shluger

Research output: Contribution to journalArticleScientificpeer-review

185 Citations (Scopus)
Original languageEnglish
Pages (from-to)477-501
Number of pages25
JournalAdvanced Materials
Volume23
Issue number4
DOIs
Publication statusPublished - 2011
MoE publication typeA1 Journal article-refereed

Keywords

  • AFM

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