Abstract
Significant progress has been made in the theoretical modelling of scanning probe microscopy. The models available now are sufficiently refined to provide information not only about the surface, but also the probe tip, and the physical changes occurring during the scanning process. This has significantly improved the quantitative analysis of experimental and theoretical results. Scanning probe microscopes can now be reliably used to analyse events on the level of single atoms and single electrons.
| Original language | English |
|---|---|
| Pages (from-to) | 427-434 |
| Number of pages | 8 |
| Journal | Current Opinion in Solid State and Materials Science |
| Volume | 5 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 2001 |
| MoE publication type | A2 Review article, Literature review, Systematic review |
Keywords
- Quantitative modelling
- Scanning force microscopy
- Scanning probe microscopy
- Scanning tunneling microscopy