Quantitative modelling in scanning probe microscopy

A. S. Foster*, W. A. Hofer, A. L. Shluger

*Corresponding author for this work

Research output: Contribution to journalReview ArticleScientificpeer-review

12 Citations (Scopus)

Abstract

Significant progress has been made in the theoretical modelling of scanning probe microscopy. The models available now are sufficiently refined to provide information not only about the surface, but also the probe tip, and the physical changes occurring during the scanning process. This has significantly improved the quantitative analysis of experimental and theoretical results. Scanning probe microscopes can now be reliably used to analyse events on the level of single atoms and single electrons.

Original languageEnglish
Pages (from-to)427-434
Number of pages8
JournalCURRENT OPINION IN SOLID STATE AND MATERIALS SCIENCE
Volume5
Issue number5
DOIs
Publication statusPublished - 2001
MoE publication typeA2 Review article in a scientific journal

Keywords

  • Quantitative modelling
  • Scanning force microscopy
  • Scanning probe microscopy
  • Scanning tunneling microscopy

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