Quantitative modelling in Scanning Force Microscopy on Insulators

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Quantitative modelling in Scanning Force Microscopy on Insulators. / Foster, Adam S.; Shluger, Alexander L.; Nieminen, Risto M.

In: Applied Surface Science, Vol. 188, No. 3-4, 2002, p. 306–318.

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@article{46c7f5eae4784332978e27c66099e443,
title = "Quantitative modelling in Scanning Force Microscopy on Insulators",
keywords = "CaF2, Calcite, Modelling, NC-AFM, CaF2, Calcite, Modelling, NC-AFM, CaF2, Calcite, Modelling, NC-AFM",
author = "Foster, {Adam S.} and Shluger, {Alexander L.} and Nieminen, {Risto M.}",
year = "2002",
doi = "10.1016/S0169-4332(01)00943-6",
language = "English",
volume = "188",
pages = "306–318",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier Science B.V.",
number = "3-4",

}

RIS - Download

TY - JOUR

T1 - Quantitative modelling in Scanning Force Microscopy on Insulators

AU - Foster, Adam S.

AU - Shluger, Alexander L.

AU - Nieminen, Risto M.

PY - 2002

Y1 - 2002

KW - CaF2

KW - Calcite

KW - Modelling

KW - NC-AFM

KW - CaF2

KW - Calcite

KW - Modelling

KW - NC-AFM

KW - CaF2

KW - Calcite

KW - Modelling

KW - NC-AFM

UR - http://www.fyslab.hut.fi/~asf/physics/Articles.html

U2 - 10.1016/S0169-4332(01)00943-6

DO - 10.1016/S0169-4332(01)00943-6

M3 - Article

VL - 188

SP - 306

EP - 318

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

IS - 3-4

ER -

ID: 3457542