Quantitative Determination of Dopant Concentration by X-Ray Fluorescence in Cerium-Activated Strontium Sulfide Films

M.J. Peussa, E. Nykänen, K. Kukli, K. Vasama, L. Niinistö

    Research output: Working paperProfessional

    Original languageEnglish
    Pages416
    Publication statusPublished - 1998
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameEuroanalysis 10, Basel, Switzerland, September 6-11, 1998

    Keywords

    • ale
    • atomic layer epitaxy
    • cerium
    • determination
    • strontium sulfide
    • thin film
    • x-ray fluorescence

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