Quantitative analyses of the O K-edge, Cu L2.3-edge and Ce M4.5-edge XANES spectra for hole-doped (La1-xSrx)2CuO4+d and electron-doped (Nd1-xCex)2CuO4+d high-quality samples

Y. Tanaka, M. Karppinen, J.M. Chen, R.S. Liu, H. Yamauchi

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationPhysical Society of Japan, 63rd Annual meeting, Kinki University, Osaka, Japan, March 23-26, 2008: No. 23pWQ-2
    Publication statusPublished - 2008
    MoE publication typeA4 Article in a conference publication

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