Quantifying the comprehensive characteristics of inclusion‐induced defects using an integrated destructive and non‐destructive method

Rongfei Juan, Min Wang*, Junhe Lian, Chao Gu, Lanxin Li, Yanping Bao

*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

3 Citations (Scopus)
104 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Quantifying the comprehensive characteristics of inclusion‐induced defects using an integrated destructive and non‐destructive method'. Together they form a unique fingerprint.

Earth and Planetary Sciences

Engineering

Material Science

Physics