@article{3487b5acaae9409aa0acc83bba13ebbf,
title = "Quality assessment of sapphire wafers for x-ray crystal optics using white beam synchrotron x-ray topography",
keywords = "sapphire, synchrotron topography, sapphire, synchrotron topography, sapphire, synchrotron topography",
author = "W.M. Chen and P.J. McNally and Yu.V. Shvydko and T. Tuomi and M. Lerche and A.N. Danilewsky and J. Kanatharana and D. Lowney and M. O´Hare and L. Knuuttila and J. Riikonen and R. Rantam{\"a}ki",
year = "2001",
language = "English",
volume = "186",
pages = "365--371",
journal = "Physica Status Solidi. A: Applications and Materials Science",
issn = "1862-6319",
publisher = "Wiley",
}