A note on analyticity properties of far field patterns

Research output: Scientific - peer-reviewArticle

Details

Original languageEnglish
Pages (from-to)491-498
JournalINVERSE PROBLEMS AND IMAGING
Volume7
Issue number2
StatePublished - 2013
MoE publication typeA1 Journal article-refereed

Researchers

Research units

    Research areas

  • far field pattern, analytic functions, inverse, scattering, partial data

ID: 786701