Processing and recombination lifetime characterization of silicon microstrip detectors

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Original languageEnglish
Pages (from-to)159-165
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
VolumeA 485
Publication statusPublished - 2002
MoE publication typeA1 Journal article-refereed

    Research areas

  • lifetime, photoconductivity decay, strip detector

ID: 4147271