Probing structure and microstructure of epitaxial Ni-Mn-Ga films by reciprocal space mapping and pole figure measurements

Yanling Ge, Oleg Heczko, Simo-Pekka Hannula, Sebastian Fähler

Research output: Contribution to journalArticleScientificpeer-review

11 Citations (Scopus)
Original languageEnglish
Pages (from-to)6665-6671
Number of pages7
JournalActa Materialia
Volume58
Issue number20
DOIs
Publication statusPublished - Dec 2010
MoE publication typeA1 Journal article-refereed

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