Probing structure and microstructure of epitaxial Ni-Mn-Ga films by reciprocal space mapping and pole figure measurements

Yanling Ge, Oleg Heczko, Simo-Pekka Hannula, Sebastian Fähler

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@article{7c99af68078d407db1f5339905ec0d8e,

title = "Probing structure and microstructure of epitaxial Ni-Mn-Ga films by reciprocal space mapping and pole figure measurements",

author = "Yanling Ge and Oleg Heczko and Simo-Pekka Hannula and Sebastian F{\"a}hler",

year = "2010",

month = dec,

doi = "10.1016/j.actamat.2010.08.029",

language = "English",

volume = "58",

pages = "6665--6671",

journal = "Acta Materialia",

issn = "1359-6454",

publisher = "Elsevier",

number = "20",

}

TY - JOUR

T1 - Probing structure and microstructure of epitaxial Ni-Mn-Ga films by reciprocal space mapping and pole figure measurements

AU - Ge, Yanling

AU - Heczko, Oleg

AU - Hannula, Simo-Pekka

AU - Fähler, Sebastian

PY - 2010/12

Y1 - 2010/12

U2 - 10.1016/j.actamat.2010.08.029

DO - 10.1016/j.actamat.2010.08.029

M3 - Article

SN - 1359-6454

VL - 58

SP - 6665

EP - 6671

JO - Acta Materialia

JF - Acta Materialia

IS - 20

ER -