Original language | English |
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Article number | 181301 |
Number of pages | 1 |
Journal | Journal of Applied Physics |
Volume | 119 |
Issue number | 18 |
DOIs | |
Publication status | Published - 14 May 2016 |
MoE publication type | B1 Article in a scientific magazine |
Preface to Special Topic: Defects in Semiconductors
Filip Tuomisto, Ilja Makkonen
Research output: Contribution to journal › Editorial › Scientific
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