Preface to Special Topic: Defects in Semiconductors

Filip Tuomisto, Ilja Makkonen

Research output: Contribution to journalEditorialScientific

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Original languageEnglish
Article number181301
Number of pages1
JournalJournal of Applied Physics
Volume119
Issue number18
DOIs
Publication statusPublished - 14 May 2016
MoE publication typeB1 Article in a scientific magazine

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