Prediction Models and Sensitivity Analysis of Industrial Process Parameters by Using the Self-Organizing Map

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationIEEE Nordic Signal Processing Symposium (NORSIG'96), Espoo, Finland, September 24-27, 1996
    Pages79-82
    Publication statusPublished - 1996
    MoE publication typeA4 Article in a conference publication

    Keywords

    • analysis
    • modeling
    • process monitoring
    • self-organizing map

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