Precision spectrometer for measurement of specular reflectance

Atte Haapalinna, Saulius Nevas, Farshid Manoocheri, Erkki Ikonen

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)2237-2241
JournalReview of Scientific Instruments
Volume73
Publication statusPublished - 2002
MoE publication typeA1 Journal article-refereed

Keywords

  • regular reflectance
  • spectrophotometry

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