(poster) Thermal stability of iron precipitates in silicon after internal gettering

Peng Zhang*, Hele Väinölä, Andrei A. Istratov, Eicke R. Weber

*Corresponding author for this work

Research output: Contribution to conferenceAbstractScientificpeer-review

Original languageEnglish
Publication statusPublished - 2003
MoE publication typeNot Eligible
EventInternational Conference on Defects in Semiconductors - Aarhus, Denmark
Duration: 28 Jul 20031 Aug 2003
Conference number: 22

Conference

ConferenceInternational Conference on Defects in Semiconductors
Abbreviated titleICDS
Country/TerritoryDenmark
CityAarhus
Period28/07/200301/08/2003

Keywords

  • Internal gettering
  • Iron
  • Re-dissolution energy barrier
  • Silicon

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