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(poster) Temperature dependence of light-induced degradation in copper-contaminated silicon

Research output: Contribution to conferenceAbstractScientificpeer-review

Abstract

Copper is a common 3d transition metal impurity in silicon solar cells, which in its interstitial state causes light-induced degradation (LID) in crystalline silicon even without any boron or oxygen. Even though copper contamination increases the degradation rate, the activation energy in copper-contaminated silicon appears to be similar to the energy barrier required for boron-oxygen defect formation.
Original languageEnglish
Publication statusPublished - 2014
MoE publication typeNot Eligible
EventEuropean Photovoltaic Solar Energy Conference and Exhibition - Amsterdam, Netherlands
Duration: 22 Sept 201426 Sept 2014
Conference number: 29

Conference

ConferenceEuropean Photovoltaic Solar Energy Conference and Exhibition
Country/TerritoryNetherlands
CityAmsterdam
Period22/09/201426/09/2014

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