(poster) Temperature dependence of light-induced degradation in copper-contaminated silicon

Jeanette Lindroos, Yacine Boulfard, Marko Yli-Koski, Hele Savin

Research output: Contribution to conferenceAbstractScientificpeer-review

Abstract

Copper is a common 3d transition metal impurity in silicon solar cells, which in its interstitial state causes light-induced degradation (LID) in crystalline silicon even without any boron or oxygen. Even though copper contamination increases the degradation rate, the activation energy in copper-contaminated silicon appears to be similar to the energy barrier required for boron-oxygen defect formation.
Original languageEnglish
Publication statusPublished - 2014
MoE publication typeNot Eligible
EventEuropean Photovoltaic Solar Energy Conference and Exhibition - Amsterdam, Netherlands
Duration: 22 Sep 201426 Sep 2014
Conference number: 29

Conference

ConferenceEuropean Photovoltaic Solar Energy Conference and Exhibition
Country/TerritoryNetherlands
CityAmsterdam
Period22/09/201426/09/2014

Fingerprint

Dive into the research topics of '(poster) Temperature dependence of light-induced degradation in copper-contaminated silicon'. Together they form a unique fingerprint.

Cite this