(poster) Flyscan Accelerates Synchrotron-Based Characterization of Silicon PV Materials

Ashley E. Morishige, Hannu S. Laine, Mallory A. Jensen, Patricia X T Yen, Erin E. Looney, Stefan Vogt, Barry Lai, Hele Savin, Tonio Buonassisi

Research output: Contribution to conferenceAbstractScientificpeer-review

Original languageEnglish
Publication statusPublished - 2017
MoE publication typeNot Eligible
EventInternational Conference on Crystalline Silicon Photovoltaics - Freiburg, Germany, Freiburg, Germany
Duration: 3 Apr 20175 Apr 2017
Conference number: 7
http://siliconpv.com/home.html

Conference

ConferenceInternational Conference on Crystalline Silicon Photovoltaics
Abbreviated titleSiliconPV 2017
Country/TerritoryGermany
CityFreiburg
Period03/04/201705/04/2017
Internet address

Keywords

  • correlative microscopy
  • detection limit
  • flyscan
  • silicon
  • synchrotron
  • X-ray fluorescence

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