(poster) Effect of low-temperature annealing on defect causing copper-related light-induced degradation in p-type silicon

Henri Vahlman; Antti Haarahiltunen; Wolfram Kwapil; Jonas Schön; Marko Yli-Koski; Alessandro Inglese; Chiara Modanese; Hele Savin

(poster) Effect of low-temperature annealing on defect causing copper-related light-induced degradation in p-type silicon

Henri Vahlman^*
, Antti Haarahiltunen
, Wolfram Kwapil
, Jonas Schön
, Marko Yli-Koski
, Alessandro Inglese
, Chiara Modanese
, Hele Savin

^*Corresponding author for this work

Fraunhofer Institute for Solar Energy Systems

Research output: Contribution to conference › Abstract › Scientific › peer-review

Original language	English
Publication status	Published - 2017
MoE publication type	Not Eligible
Event	International Conference on Crystalline Silicon Photovoltaics - Freiburg, Germany, Freiburg, Germany Duration: 3 Apr 2017 → 5 Apr 2017 Conference number: 7 http://siliconpv.com/home.html

Conference

Conference	International Conference on Crystalline Silicon Photovoltaics
Abbreviated title	SiliconPV 2017
Country/Territory	Germany
City	Freiburg
Period	03/04/2017 → 05/04/2017
Internet address	http://siliconpv.com/home.html

Keywords

Cu
LID
precipitate
recovery
silicon

Cite this

@conference{b26c9632ec6847f6ad33081263552ad4,

title = "(poster) Effect of low-temperature annealing on defect causing copper-related light-induced degradation in p-type silicon",

keywords = "Cu, LID, precipitate, recovery, silicon",

author = "Henri Vahlman and Antti Haarahiltunen and Wolfram Kwapil and Jonas Sch{\"o}n and Marko Yli-Koski and Alessandro Inglese and Chiara Modanese and Hele Savin",

year = "2017",

language = "English",

note = "International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2017 ; Conference date: 03-04-2017 Through 05-04-2017",

url = "http://siliconpv.com/home.html",

}

(poster) Effect of low-temperature annealing on defect causing copper-related light-induced degradation in p-type silicon. / Vahlman, Henri; Haarahiltunen, Antti; Kwapil, Wolfram et al.
2017. Abstract from International Conference on Crystalline Silicon Photovoltaics, Freiburg, Germany.

Research output: Contribution to conference › Abstract › Scientific › peer-review

TY - CONF

T1 - (poster) Effect of low-temperature annealing on defect causing copper-related light-induced degradation in p-type silicon

AU - Vahlman, Henri

AU - Haarahiltunen, Antti

AU - Kwapil, Wolfram

AU - Schön, Jonas

AU - Yli-Koski, Marko

AU - Inglese, Alessandro

AU - Modanese, Chiara

AU - Savin, Hele

N1 - Conference code: 7

PY - 2017

Y1 - 2017

KW - Cu

KW - LID

KW - precipitate

KW - recovery

KW - silicon

M3 - Abstract

T2 - International Conference on Crystalline Silicon Photovoltaics

Y2 - 3 April 2017 through 5 April 2017

ER -