(poster) Detection of low-level copper contamination in p-type silicon by means of microwave photoconductive decay measurements

Research output: Contribution to conference › Abstract › Scientific › peer-review

Original language	English
Publication status	Published - 2002
MoE publication type	Not Eligible
Event	International Conference on Defects in Semiconductors - Bologna, Italy Duration: 3 Jun 2002 → 7 Jun 2002

Conference	International Conference on Defects in Semiconductors
Abbreviated title	ICDS
Country/Territory	Italy
City	Bologna
Period	03/06/2002 → 07/06/2002

Cite this

@conference{dc0c99584ae74ecfaea56272fba580d7,

title = "(poster) Detection of low-level copper contamination in p-type silicon by means of microwave photoconductive decay measurements",

author = "Marko Yli-Koski and \{V{\"a}in{\"o}l{\"a} (Savin)\}, Hele and Martti Palokangas and Antti Haarahiltunen and Juha Sinkkonen",

year = "2002",

language = "English",

note = "International Conference on Defects in Semiconductors, ICDS ; Conference date: 03-06-2002 Through 07-06-2002",

}

Research output: Contribution to conference › Abstract › Scientific › peer-review

TY - CONF

T1 - (poster) Detection of low-level copper contamination in p-type silicon by means of microwave photoconductive decay measurements

AU - Yli-Koski, Marko

AU - Väinölä (Savin), Hele

AU - Palokangas, Martti

AU - Haarahiltunen, Antti

AU - Sinkkonen, Juha

PY - 2002

Y1 - 2002

M3 - Abstract

T2 - International Conference on Defects in Semiconductors

Y2 - 3 June 2002 through 7 June 2002

ER -