(poster) 3D Effects on Minority Carrier Recombination in Homogeneous Silicon Wafers

^*Corresponding author for this work

Research output: Contribution to conference › Abstract › Scientific › peer-review

Original language	English
Publication status	Published - 2001
MoE publication type	Not Eligible
Event	Conference on Gettering and Defect Engineering in Semiconductor Technology - Catania, Italy Duration: 30 Sept 2001 → 5 Oct 2001 Conference number: 9th

Conference	Conference on Gettering and Defect Engineering in Semiconductor Technology
Abbreviated title	GADEST
Country/Territory	Italy
City	Catania
Period	30/09/2001 → 05/10/2001

Cite this

@conference{e343c0bfbc824126b7a9f26e672b9c34,

title = "(poster) 3D Effects on Minority Carrier Recombination in Homogeneous Silicon Wafers",

author = "Jan Storg{\aa}rds and \{V{\"a}in{\"o}l{\"a} (Savin)\}, Hele and Marko Yli-Koski and Juha Sinkkonen",

year = "2001",

language = "English",

note = "Conference on Gettering and Defect Engineering in Semiconductor Technology, GADEST ; Conference date: 30-09-2001 Through 05-10-2001",

}

TY - CONF

T1 - (poster) 3D Effects on Minority Carrier Recombination in Homogeneous Silicon Wafers

AU - Storgårds, Jan

AU - Väinölä (Savin), Hele

AU - Yli-Koski, Marko

AU - Sinkkonen, Juha

N1 - Conference code: 9th

PY - 2001

Y1 - 2001

M3 - Abstract

T2 - Conference on Gettering and Defect Engineering in Semiconductor Technology

Y2 - 30 September 2001 through 5 October 2001

ER -