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Positron trapping at divacancies in thin polycrystalline CdTe films deposited on glass

  • L. Liszkay
  • , C. Corbel
  • , L. Baroux
  • , P. Hautojärvi
  • , M. Bayhan
  • , A. Brinkamn
  • , S. Tatarenko

Research output: Contribution to journalArticleScientificpeer-review

131 Citations (Scopus)
Original languageEnglish
Pages (from-to)1380-1382
JournalApplied Physics Letters
Volume64
Publication statusPublished - 1994
MoE publication typeA1 Journal article-refereed

Keywords

  • defect
  • positron annihilation
  • semiconductor film

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