Positron trapping at divacancies in thin polycrystalline CdTe films deposited on glass

L. Liszkay, C. Corbel, L. Baroux, P. Hautojärvi, M. Bayhan, A. Brinkamn, S. Tatarenko

Research output: Contribution to journalArticleScientificpeer-review

113 Citations (Scopus)
Original languageEnglish
Pages (from-to)1380-1382
JournalApplied Physics Letters
Volume64
Publication statusPublished - 1994
MoE publication typeA1 Journal article-refereed

Keywords

  • defect
  • positron annihilation
  • semiconductor film

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