Positron annihilation studies of defects at the SiO2/SiC interface

James Dekker, Kimmo Saarinen, H. Olafsson, E. Sveinbjörnsson

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
JournalMaterials Science Forum
Volume433-436
Publication statusPublished - 2003
MoE publication typeA1 Journal article-refereed

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