Porometry, porosimetry, image analysis and void network modelling in the study of the pore-level properties of filters

Christopher M. Gribble; Graham Peter Matthews; Giuliano M. Laudone; Andrew Turner; Cathy J. Ridgway; Joachim Schoelkopf; Patrick A.C. Gane

doi:10.1016/j.ces.2011.05.013

Porometry, porosimetry, image analysis and void network modelling in the study of the pore-level properties of filters

Christopher M. Gribble
, Graham Peter Matthews
, Giuliano M. Laudone
, Andrew Turner
, Cathy J. Ridgway
, Joachim Schoelkopf
, Patrick A.C. Gane

Research output: Contribution to journal › Article › Scientific › peer-review

48 Citations (Scopus)

Original language	English
Pages (from-to)	3701-3709
Journal	Chemical Engineering Science
Volume	66
Issue number	16
DOIs	https://doi.org/10.1016/j.ces.2011.05.013
Publication status	Published - 2011
MoE publication type	A1 Journal article-refereed

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10.1016/j.ces.2011.05.013

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title = "Porometry, porosimetry, image analysis and void network modelling in the study of the pore-level properties of filters",

author = "Gribble, \{Christopher M.\} and Matthews, \{Graham Peter\} and Laudone, \{Giuliano M.\} and Andrew Turner and Ridgway, \{Cathy J.\} and Joachim Schoelkopf and Gane, \{Patrick A.C.\}",

year = "2011",

doi = "10.1016/j.ces.2011.05.013",

language = "English",

volume = "66",

pages = "3701--3709",

journal = "Chemical Engineering Science",

issn = "0009-2509",

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T1 - Porometry, porosimetry, image analysis and void network modelling in the study of the pore-level properties of filters

AU - Gribble, Christopher M.

AU - Matthews, Graham Peter

AU - Laudone, Giuliano M.

AU - Turner, Andrew

AU - Ridgway, Cathy J.

AU - Schoelkopf, Joachim

AU - Gane, Patrick A.C.

PY - 2011

Y1 - 2011

UR - http://dx.doi.org/10.1016/j.ces.2011.05.013

U2 - 10.1016/j.ces.2011.05.013

DO - 10.1016/j.ces.2011.05.013

M3 - Article

SN - 0009-2509

VL - 66

SP - 3701

EP - 3709

JO - Chemical Engineering Science

JF - Chemical Engineering Science

IS - 16

ER -

Porometry, porosimetry, image analysis and void network modelling in the study of the pore-level properties of filters

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