Pion induced displacement damage in silicon devices

Research output: Contribution to journalArticleScientificpeer-review

Researchers

  • M. Huhtinen
  • P. Aarnio

Research units

Details

Original languageEnglish
Pages (from-to)580-582
JournalNuclear Instruments and Methods in Physics Research A
Volume335
Publication statusPublished - 1993
MoE publication typeA1 Journal article-refereed

    Research areas

  • pion, radiation damage, semiconductors

ID: 4967176