@article{4808e04234f949ca87c56bec4b1579fc,
title = "Pion induced displacement damage in silicon devices",
keywords = "pion, radiation damage, semiconductors, pion, radiation damage, semiconductors, pion, radiation damage, semiconductors",
author = "M. Huhtinen and P. Aarnio",
year = "1993",
language = "English",
volume = "335",
pages = "580--582",
journal = "NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT",
issn = "0168-9002",
publisher = "Elsevier",
}