Pion induced displacement damage in silicon devices

M. Huhtinen, P. Aarnio

Research output: Contribution to journalArticleScientificpeer-review

66 Citations (Scopus)
Original languageEnglish
Pages (from-to)580-582
JournalNuclear Instruments and Methods in Physics Research A
Volume335
Publication statusPublished - 1993
MoE publication typeA1 Journal article-refereed

Keywords

  • pion
  • radiation damage
  • semiconductors

Cite this