Phase-sweep method for characterization of cw-laser-induced dielectric gratings

Ping Xia; J. P. Partanen

doi:10.1364/OL.19.000378

Phase-sweep method for characterization of cw-laser-induced dielectric gratings

Ping Xia, J. P. Partanen

Not published at Aalto University

University of Southern California

Research output: Contribution to journal › Article › Scientific › peer-review

3 Citations (Scopus)

Abstract

We present a new phase-sweep method for characterizing laser-induced complex dielectric gratings. This characterization requires four parameters: the amplitudes and the spatial phases of both the refractive-index and the absorption components. We apply this phase-sweep method to study a complex polarizability grating in a nominally undoped cubic photorefractive Bi₁₂TiO₂₀ crystal. We determine the polarizability difference a_fe between a full and an empty photoexcitable deep trap at 633 nm in Bi₁₂TiO₂₀ to be (2.5 - 8.3i ± 1.0 ± 3.3i) × 10^-40 F m² in SI units or (2.3 - 7.5i ± 0.9 ± 3.0i) × 10^-24 cm³ in Gaussian units.

Original language	English
Pages (from-to)	378-380
Number of pages	3
Journal	Optics Letters
Volume	19
Issue number	6
DOIs	https://doi.org/10.1364/OL.19.000378
Publication status	Published - 1994
MoE publication type	A1 Journal article-refereed

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title = "Phase-sweep method for characterization of cw-laser-induced dielectric gratings",

abstract = "We present a new phase-sweep method for characterizing laser-induced complex dielectric gratings. This characterization requires four parameters: the amplitudes and the spatial phases of both the refractive-index and the absorption components. We apply this phase-sweep method to study a complex polarizability grating in a nominally undoped cubic photorefractive Bi12TiO20 crystal. We determine the polarizability difference afe between a full and an empty photoexcitable deep trap at 633 nm in Bi12TiO20 to be (2.5 - 8.3i ± 1.0 ± 3.3i) × 10-40 F m2 in SI units or (2.3 - 7.5i ± 0.9 ± 3.0i) × 10-24 cm3 in Gaussian units.",

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doi = "10.1364/OL.19.000378",

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T1 - Phase-sweep method for characterization of cw-laser-induced dielectric gratings

AU - Xia, Ping

AU - Partanen, J. P.

PY - 1994

Y1 - 1994

N2 - We present a new phase-sweep method for characterizing laser-induced complex dielectric gratings. This characterization requires four parameters: the amplitudes and the spatial phases of both the refractive-index and the absorption components. We apply this phase-sweep method to study a complex polarizability grating in a nominally undoped cubic photorefractive Bi12TiO20 crystal. We determine the polarizability difference afe between a full and an empty photoexcitable deep trap at 633 nm in Bi12TiO20 to be (2.5 - 8.3i ± 1.0 ± 3.3i) × 10-40 F m2 in SI units or (2.3 - 7.5i ± 0.9 ± 3.0i) × 10-24 cm3 in Gaussian units.

AB - We present a new phase-sweep method for characterizing laser-induced complex dielectric gratings. This characterization requires four parameters: the amplitudes and the spatial phases of both the refractive-index and the absorption components. We apply this phase-sweep method to study a complex polarizability grating in a nominally undoped cubic photorefractive Bi12TiO20 crystal. We determine the polarizability difference afe between a full and an empty photoexcitable deep trap at 633 nm in Bi12TiO20 to be (2.5 - 8.3i ± 1.0 ± 3.3i) × 10-40 F m2 in SI units or (2.3 - 7.5i ± 0.9 ± 3.0i) × 10-24 cm3 in Gaussian units.

UR - https://www.scopus.com/pages/publications/0028388113

U2 - 10.1364/OL.19.000378

DO - 10.1364/OL.19.000378

M3 - Article

AN - SCOPUS:0028388113

SN - 0146-9592

VL - 19

SP - 378

EP - 380

JO - Optics Letters

JF - Optics Letters

IS - 6

ER -

Phase-sweep method for characterization of cw-laser-induced dielectric gratings

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