Phase-sweep method for characterization of cw-laser-induced dielectric gratings

Ping Xia, J. P. Partanen

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

Abstract

We present a new phase-sweep method for characterizing laser-induced complex dielectric gratings. This characterization requires four parameters: the amplitudes and the spatial phases of both the refractive-index and the absorption components. We apply this phase-sweep method to study a complex polarizability grating in a nominally undoped cubic photorefractive Bi12TiO20 crystal. We determine the polarizability difference afe between a full and an empty photoexcitable deep trap at 633 nm in Bi12TiO20 to be (2.5 - 8.3i ± 1.0 ± 3.3i) × 10-40 F m2 in SI units or (2.3 - 7.5i ± 0.9 ± 3.0i) × 10-24 cm3 in Gaussian units.

Original languageEnglish
Pages (from-to)378-380
Number of pages3
JournalOptics Letters
Volume19
Issue number6
DOIs
Publication statusPublished - 1994
MoE publication typeA1 Journal article-refereed

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