Periodic Time Domain Waveform Measurement System for Non-Linear Device Characterisation

Kari Lehtinen; Markku Sipilä

Periodic Time Domain Waveform Measurement System for Non-Linear Device Characterisation

Kari Lehtinen, Markku Sipilä

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	International IEEE Workshop on Experimentally Based FET Device Modelling & Related Circuit Design, University of Kassel, Germany, 17-18 July 1997
Pages	7
Publication status	Published - 1997
MoE publication type	A4 Article in a conference publication

Keywords

periodic time domain waveform

Cite this

@inproceedings{f773a223f7ed4b8aa15657a14b47febc,

title = "Periodic Time Domain Waveform Measurement System for Non-Linear Device Characterisation",

keywords = "periodic time domain waveform, periodic time domain waveform, periodic time domain waveform",

author = "Kari Lehtinen and Markku Sipil{\"a}",

year = "1997",

language = "English",

pages = "7",

booktitle = "International IEEE Workshop on Experimentally Based FET Device Modelling & Related Circuit Design, University of Kassel, Germany, 17-18 July 1997",

}

Periodic Time Domain Waveform Measurement System for Non-Linear Device Characterisation. / Lehtinen, Kari; Sipilä, Markku.

International IEEE Workshop on Experimentally Based FET Device Modelling & Related Circuit Design, University of Kassel, Germany, 17-18 July 1997. 1997. p. 7.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Periodic Time Domain Waveform Measurement System for Non-Linear Device Characterisation

AU - Lehtinen, Kari

AU - Sipilä, Markku

PY - 1997

Y1 - 1997

KW - periodic time domain waveform

M3 - Conference contribution

SP - 7

BT - International IEEE Workshop on Experimentally Based FET Device Modelling & Related Circuit Design, University of Kassel, Germany, 17-18 July 1997

ER -