Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows

Pekka T. Törmä, Jari Kostamo, Heikki Sipilä, Marco Mattila, Pasi Kostamo, Esa Kostamo, Harri Lipsanen, Christian Laubis, Frank Scholze, Nick Nelms, Brian Shortt, Marcos Bavdaz

Research output: Contribution to journalArticleScientificpeer-review

8 Citations (Scopus)
Original languageEnglish
Pages (from-to)695-699
Number of pages5
JournalIEEE Transactions on Nuclear Science
Volume61
Issue number1
DOIs
Publication statusPublished - Jan 2014
MoE publication typeA1 Journal article-refereed

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OtaNano

Anna Rissanen (Manager)

Aalto University

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  • Cite this

    Törmä, P. T., Kostamo, J., Sipilä, H., Mattila, M., Kostamo, P., Kostamo, E., Lipsanen, H., Laubis, C., Scholze, F., Nelms, N., Shortt, B., & Bavdaz, M. (2014). Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows. IEEE Transactions on Nuclear Science, 61(1), 695-699. https://doi.org/10.1109/TNS.2014.2298434