Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University

Hua Jiang, Janne Ruokolainen, Neil Young, Tetsuo Oikawa, Albert G. Nasibulin, Angus Kirkland, Esko I. Kauppinen

Research output: Contribution to journalArticleScientificpeer-review

12 Citations (Scopus)
Original languageEnglish
Pages (from-to)545-550
Number of pages6
JournalMICRON
Volume43
Issue number4
DOIs
Publication statusPublished - Mar 2012
MoE publication typeA1 Journal article-refereed

Keywords

  • TEM

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