Oxygen-related defects in Si and GaAs

M. Pesola, Y.-J. Lee, R.M. Nieminen, J. von Boehm

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationPSIK-2000 Conference, Schwäbisch Gmund, 22-26 August 2000,
Pages95
Publication statusPublished - 2000
MoE publication typeA4 Article in a conference publication

Keywords

  • GaAs
  • oxygen defect
  • silicon

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