(oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact

Hannu S. Laine; Henri Vahlman; Antti Haarahiltunen; Mallory A. Jensen; Chiara Modanese; Matthias Wagner; Franziska Wolny; Tonio Buonassisi; Hele Savin

(oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact

Hannu S. Laine, Henri Vahlman, Antti Haarahiltunen, Mallory A. Jensen, Chiara Modanese, Matthias Wagner, Franziska Wolny, Tonio Buonassisi, Hele Savin^*

^*Corresponding author for this work

Research output: Contribution to conference › Abstract › Scientific › peer-review

Original language	English
Publication status	Published - 2018
MoE publication type	Not Eligible
Event	International Conference on Crystalline Silicon Photovoltaics - Lausanne, Switzerland Duration: 18 Mar 2018 → 21 Mar 2018 Conference number: 8th

Conference

Conference	International Conference on Crystalline Silicon Photovoltaics
Abbreviated title	SiliconPV
Country/Territory	Switzerland
City	Lausanne
Period	18/03/2018 → 21/03/2018

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

2 Finished

Black silicon and defect engineering for highly efficient solar cells and modules, BLACK
Savin, H., Laine, H., Yli-Koski, M., Vähänissi, V., Modanese, C., Pasanen, T., Rauha, I., von Gastrow, G., Liu, Z. & Haarahiltunen, A.
01/03/2015 → 28/02/2018
Project: Business Finland: Other research funding
Riddle of light induced degradation in silicon photovoltaics
Savin, H., Yli-Koski, M., Vahlman, H., Inglese, A., Rauha, I., Laine, H., Modanese, C., Nampalli, N., Huang, H., Lindroos, J., von Gastrow, G. & Vähänissi, V.
01/12/2012 → 31/12/2017
Project: EU: ERC grants

Cite this

Laine, Hannu S. ; Vahlman, Henri ; Haarahiltunen, Antti ; Jensen, Mallory A. ; Modanese, Chiara ; Wagner, Matthias ; Wolny, Franziska ; Buonassisi, Tonio ; Savin, Hele. / (oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact. Abstract from International Conference on Crystalline Silicon Photovoltaics, Lausanne, Switzerland.

@conference{2c913aab423a4b88a82927deba154b66,

title = "(oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact",

author = "Laine, {Hannu S.} and Henri Vahlman and Antti Haarahiltunen and Jensen, {Mallory A.} and Chiara Modanese and Matthias Wagner and Franziska Wolny and Tonio Buonassisi and Hele Savin",

note = "| openaire: EC/FP7/307315/EU//SOLARX; International Conference on Crystalline Silicon Photovoltaics, SiliconPV ; Conference date: 18-03-2018 Through 21-03-2018",

year = "2018",

language = "English",

}

(oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact. / Laine, Hannu S.; Vahlman, Henri; Haarahiltunen, Antti; Jensen, Mallory A.; Modanese, Chiara; Wagner, Matthias; Wolny, Franziska; Buonassisi, Tonio; Savin, Hele.

2018. Abstract from International Conference on Crystalline Silicon Photovoltaics, Lausanne, Switzerland.

Research output: Contribution to conference › Abstract › Scientific › peer-review

TY - CONF

T1 - (oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact

AU - Laine, Hannu S.

AU - Vahlman, Henri

AU - Haarahiltunen, Antti

AU - Jensen, Mallory A.

AU - Modanese, Chiara

AU - Wagner, Matthias

AU - Wolny, Franziska

AU - Buonassisi, Tonio

AU - Savin, Hele

N1 - Conference code: 8th

PY - 2018

Y1 - 2018

M3 - Abstract

T2 - International Conference on Crystalline Silicon Photovoltaics

Y2 - 18 March 2018 through 21 March 2018

ER -

(oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact

Conference

UN SDGs

Projects

Black silicon and defect engineering for highly efficient solar cells and modules, BLACK

Riddle of light induced degradation in silicon photovoltaics

Cite this