(oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact

Hannu S. Laine, Henri Vahlman, Antti Haarahiltunen, Mallory A. Jensen, Chiara Modanese, Matthias Wagner, Franziska Wolny, Tonio Buonassisi, Hele Savin*

*Corresponding author for this work

Research output: Contribution to conferenceAbstractScientificpeer-review

Original languageEnglish
Publication statusPublished - 2018
MoE publication typeNot Eligible
EventInternational Conference on Crystalline Silicon Photovoltaics - Lausanne, Switzerland
Duration: 18 Mar 201821 Mar 2018
Conference number: 8th


ConferenceInternational Conference on Crystalline Silicon Photovoltaics
Abbreviated titleSiliconPV

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