(oral talk) Reducing light-induced degradation in multi-crystalline silicon

Jeanette Lindroos, Yacine Boulfrad, Marko Yli-Koski, Hele Savin

Research output: Contribution to conferenceAbstractScientificpeer-review

Original languageEnglish
Publication statusPublished - 2013
MoE publication typeNot Eligible
EventConference on Gettering and Defect Engineering in Semiconductor Technology - Oxford, United Kingdom
Duration: 22 Jul 201327 Jul 2013
Conference number: 15

Conference

ConferenceConference on Gettering and Defect Engineering in Semiconductor Technology
Abbreviated titleGADEST
Country/TerritoryUnited Kingdom
CityOxford
Period22/07/201327/07/2013

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